pingspice.analysis.diode.Diode_Finder(param.ParameterFinder, DiodeMixin)
class documentation
Part of pingspice.analysis.diode
(View In Hierarchy)
Known subclasses: pingspice.lib.diodes.MBR40250_Finder, pingspice.lib.diodes.MUR420_Finder
I am a parameter finder for all stand-alone diodes.
Method | setup | Undocumented |
Method | sc_parasitics | Undocumented |
Method | stc_231 | Setup 231: Forward-bias current Iac vs Vac, vs Tj. |
Method | stc_232 | Setup 232: Forward-bias current Iac vs Vac, with no temperature dependency. |
Method | stc_261 | Undocumented |
Method | stc_341 | Reverse recovery time. The diode is forward-biased with I_rr and then the current decreases, crossing into negative territory, at a rate of dIdt_rr V/sec. |
Method | stc_441 | Setup 441: Capacitance, dynamically measured with biased sinusioid: |
Method | setupTestCircuit | Sets up the test circuit for the specified setup ID during parameter finding, with the anode tied to ground. |
Method | _checkTestConditions | Called by stc_341
to ensure that this device's test conditions have been specified for this
setup ID. |
Inherited from DiodeMixin:
Method | sc_diode_fwd | The forward-biased diode primitive. Call with Elements
instance f, anode node na, and cathode node nc. |
Method | sc_diode_rev | The reverse-biased diode primitive. Call with |
Inherited from DiodeMixin:
Method | sc_diode_fwd | The forward-biased diode primitive. Call with Elements
instance f, anode node na, and cathode node nc. |
Method | sc_diode_rev | The reverse-biased diode primitive. Call with |
Called by stc_341
to ensure that this device's test conditions have been specified for this
setup ID.
Reverse recovery time. The diode is forward-biased with I_rr and then the current decreases, crossing into negative territory, at a rate of dIdt_rr V/sec.
Setup 441: Capacitance, dynamically measured with biased sinusioid:
+-----------------+ +--------+ | | | | | +--(+)--> npos |>-------->-------->|C >\ | | | : | | V | | | : | | V | | | : | | V | | | +--< nneg |<-----<-----------<|A </ | | | | | | | | | 0 | +--------+ | | | | | CM.aB | | | | | +-------< bias |>---+ | | | | cap |>---|-----------------------------: 'cap1' | | | | filt_in |<---+ | | | filt_out |>---------------------------------: 'bias1' | | +-----------------+
Leakage current from the DC bias at the cathode could affect capacitance measurement, but should be very small.
See Also | MOSFET_Finder.stc_421
for an analogous test setup of what is mostly the body diode capacitance of
a MOSFET. |