I am a parameter finder for all stand-alone diodes.

Method setup Undocumented
Method sc_parasitics Undocumented
Method stc_231 Setup 231: Forward-bias current Iac vs Vac, vs Tj.
Method stc_232 Setup 232: Forward-bias current Iac vs Vac, with no temperature dependency.
Method stc_261 Undocumented
Method stc_341 Reverse recovery time. The diode is forward-biased with I_rr and then the current decreases, crossing into negative territory, at a rate of dIdt_rr V/sec.
Method stc_441

Setup 441: Capacitance, dynamically measured with biased sinusioid:

Method setupTestCircuit Sets up the test circuit for the specified setup ID during parameter finding, with the anode tied to ground.
Method _checkTestConditions Called by stc_341 to ensure that this device's test conditions have been specified for this setup ID.

Inherited from DiodeMixin:

Method sc_diode_fwd The forward-biased diode primitive. Call with Elements instance f, anode node na, and cathode node nc.
Method sc_diode_rev

The reverse-biased diode primitive. Call with Elements instance f, anode node na, and cathode node nc.:

Inherited from DiodeMixin:

Method sc_diode_fwd The forward-biased diode primitive. Call with Elements instance f, anode node na, and cathode node nc.
Method sc_diode_rev

The reverse-biased diode primitive. Call with Elements instance f, anode node na, and cathode node nc.:

def setup(self, f):
def sc_parasitics(self, f):
Undocumented
def stc_231(self, f):

Setup 231: Forward-bias current Iac vs Vac, vs Tj.

def stc_232(self, f):

Setup 232: Forward-bias current Iac vs Vac, with no temperature dependency.

def stc_261(self, f):
Undocumented
def _checkTestConditions(self, ID):

Called by stc_341 to ensure that this device's test conditions have been specified for this setup ID.

def stc_341(self, f):

Reverse recovery time. The diode is forward-biased with I_rr and then the current decreases, crossing into negative territory, at a rate of dIdt_rr V/sec.

def stc_441(self, f):

Setup 441: Capacitance, dynamically measured with biased sinusioid:

   +-----------------+                   +--------+
   |                 |                   |        |
   |  +--(+)--> npos |>-------->-------->|C >\    |
   |  |          :   |                   |   V    |
   |  |          :   |                   |   V    |
   |  |          :   |                   |   V    |
   |  |    +--< nneg |<-----<-----------<|A </    |
   |  |    |         |                   |        |
   |  |    0         |                   +--------+
   |  |              |
   |  |   CM.aB      |
   |  |              |
   |  +-------< bias |>---+
   |                 |    |
   |             cap |>---|-----------------------------: 'cap1'
   |                 |    |
   |         filt_in |<---+
   |                 |
   |        filt_out |>---------------------------------: 'bias1'
   |                 |
   +-----------------+

Leakage current from the DC bias at the cathode could affect capacitance measurement, but should be very small.

See AlsoMOSFET_Finder.stc_421 for an analogous test setup of what is mostly the body diode capacitance of a MOSFET.
def setupTestCircuit(self, f, ID):

Sets up the test circuit for the specified setup ID during parameter finding, with the anode tied to ground.

API Documentation for pingspice, generated by pydoctor at 2021-09-18 08:41:11.